Optimal test-set selection for fault diagnosis improvement

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2011, Pages 93-99

  Amati, L ^a   Bolchini, C ^a   Salice, F ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

Fault diagnosis; Integer linear programming; Test sets minimization

Indexed keywords

ANALYTICAL METHOD; CARDINALITIES; DIAGNOSTIC CAPABILITIES; INITIAL PHASIS; INTEGER LINEAR PROGRAMMING; MAXIMUM COVERAGE; OPTIMAL TEST SET; PROBLEM FORMULATION; TEST SETS;

DEFECTS; FAILURE ANALYSIS; INTEGER PROGRAMMING; NANOTECHNOLOGY; OPTIMIZATION;

FAULT TOLERANCE;

EID: 84855798675     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2011.57     Document Type: Conference Paper

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