SLIDER: A fast and accurate defect simulation framework

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2011, Pages 172-177

  Tam, Wing Chiu ^a   Blanton, R D ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

defect modeling; layout analysis; mixed signal simulation; volume diagnosis; yield learning

Indexed keywords

DEFECT MODELING; LAYOUT ANALYSIS; MIXED-SIGNAL SIMULATION; VOLUME DIAGNOSIS; YIELD LEARNING;

DESIGN; EXPERIMENTS; INDUSTRIAL APPLICATIONS; INTEGRATED CIRCUIT TESTING; VLSI CIRCUITS;

DEFECTS;

EID: 79959644377     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2011.5783779     Document Type: Conference Paper

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