Contact length scaling in graphene field-effect transistors

Applied Physics Letters

Volumn 100, Issue 10, 2012, Pages

  Xu, Haitao ^a   Wang, Sheng ^a   Zhang, Zhiyong ^a   Wang, Zhenxing ^a   Xu, Huilong ^a   Peng, Lian Mao ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER INJECTION; CONTACT LENGTH; ELECTRON-HOLE ASYMMETRY; NONLINEAR SCREENING; ON-CURRENTS; POTENTIAL BARRIERS; TRANSFER LENGTHS;

DIAGNOSIS; FIELD EFFECT TRANSISTORS; TRANSCONDUCTANCE;

GRAPHENE;

EID: 84863346247     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3691629     Document Type: Article

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