Direct transport imaging in planar structures

Applied Physics Letters

Volumn 84, Issue 8, 2004, Pages 1329-1331

  Haegel, N M ^a   Fabbri, J D ^b   Coleman, M P ^b  

^a NAVAL POSTGRADUATE SCHOOL   (United States)

^b FAIRFIELD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER RECOMBINATION; SPATIAL RESOLUTION;

CARRIER MOBILITY; CATHODOLUMINESCENCE; CHARGE COUPLED DEVICES; CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION; ELECTRIC FIELDS; ELECTRON BEAMS; EPITAXIAL GROWTH; PHOTOREFRACTIVE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM;

MOLECULAR STRUCTURE;

EID: 1642384452     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1650544     Document Type: Article

References (10)

1. S. J. Pearton, Handbook of Advanced Electronic and Photonic Materials and Devices (Academic, New York, 2001), Vol. 1, p. 179.
2. D. D. Nolte, J. Appl. Phys. 85, 6259 (1999).
3. For extensive CL information, see B. G. Yacobi and D. B. Holt, Cathod-oluminescence Microscopy of Inorganic Solids (Plenum, New York, 1990).
4. J. R. Haynes and W. Shockley, Phys. Rev. 81, 835 (1951).
5. R. A. Höpfel, J. Shah, P. A. Wolff, and A. C. Gossard, Phys. Rev. Lett. 56, 2736 (1986).
6. M. Bieler, J. Hübner, M. Oestreich, M. Koch, G. Hein, K. Pierz, and U. Siegner, J. Appl. Phys. 91, 9869 (2002).
7. G. Gilliland, Mater. Sci. Eng., R. 18, 99 (1997).
8. B. L. Cardozo, E. E, Haller, L. Reichertz, and J. W. Beeman, Appl. Phys. Lett. 83, 3990 (2003).
9. G. Chen and J, Zhou, Boundary Element Methods (Academic, London, 1992).
10. I. Stakgold, Boundary Value Problems of Mathematical Physics (Macmillan, New York, 1967), Vol. II, pp. 53-55.