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Volumn 100, Issue 8, 2012, Pages

Low leakage current in metal-insulator-metal capacitors of structural Al 2O 3/TiO 2/Al 2O 3 dielectrics

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION MECHANISM; ELECTRICAL TRANSPORT MECHANISMS; FREQUENCY DISPERSION EFFECT; HIGH-CAPACITANCE DENSITY; LOW-LEAKAGE CURRENT; METAL-INSULATOR-METAL CAPACITORS; MIM CAPACITORS;

EID: 84863260855     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3687702     Document Type: Article
Times cited : (45)

References (14)
  • 13
    • 0037233037 scopus 로고    scopus 로고
    • 10.1016/S0167-5729(02)00100-0
    • U. Diebold, Surf. Sci. Rep. 48, 53 (2003). 10.1016/S0167-5729(02)00100-0
    • (2003) Surf. Sci. Rep. , vol.48 , pp. 53
    • Diebold, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.