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Volumn 111, Issue 3, 2012, Pages

Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains

(8) Williams, Jesse R a Píš, Igor b,c Kobata, Masaaki b Winkelmann, Aimo d Matsushita, Tomohiro e Adachi, Yutaka a Ohashi, Naoki a Kobayashi, Keisuke b,f

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b National Institute for Materials Science (Japan)

c CHARLES UNIVERSITY (Czech Republic)

d MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

e JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

f HIROSHIMA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCH WAVES; CLUSTER MODELS; HARD X RAY; IN-PLANE ORIENTATION; ORBITALS; POLARITY DETERMINATION; POLYCRYSTALLINE ZINC OXIDES; POLYCRYSTALLINE ZNO; ROTATION DOMAIN; X-RAY PHOTOELECTRON DIFFRACTION; ZNO; ZNO SINGLE CRYSTALS;

DIFFRACTION; OXIDE FILMS; PHOTOELECTRONS; PHOTONS; X RAYS;

ZINC OXIDE;

EID: 84863181620 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3682088 Document Type: Article

Times cited : (13)

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