Development of the hard-X-ray angle resolved X-ray photoemission spectrometer for laboratory use

Analytical Sciences

Volumn 26, Issue 2, 2010, Pages 227-232

  Kobata, Masaaki ^a   Píš, Igor ^a,b   Iwai, Hideo ^a   Yamazui, Hiromichi ^c   Takahashi, Hiroaki ^c   Suzuki, Mineharu ^c   Matsuda, Hiroyuki ^d   Daimon, Hiroshi ^d   Kobayashi, Keisuke ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b CHARLES UNIVERSITY   (Czech Republic)

^c ULVAC PHI Inc   (Japan)

^d NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON GUNS; FILM PREPARATION; KINETIC ENERGY; KINETICS; MULTILAYER FILMS; MULTILAYERS; OPTICAL INSTRUMENT LENSES; SPECTROMETERS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

ACCEPTANCE ANGLE; ANGLE ACCEPTANCE; ANGLE RESOLUTION; ELECTRON ANALYZER; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HEMISPHERICAL ANALYZERS; MULTI-LAYER THIN FILM; X-RAY PHOTOEMISSIONS;

CHROMIUM METALLOGRAPHY;

EID: 77949877332     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.26.227     Document Type: Article

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