Determination of the polarities of ZnO thin films on polar and nonpolar substrates using scanning nonlinear dielectric microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 5 B, 2000, Pages 3121-3124

  Kazuta, Satoshi ^a   Cho, Yasuo ^a   Odagawa, Hiroyuki ^a   Kadota, Michio ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b MURATA MANUFACTURING CO LTD   (Japan)

Author keywords

Determination of polarity; Polar materials; Scanning nonlinear dielectric microscopy; ZnO thin film

Indexed keywords

ANISOTROPY; MICROSCOPIC EXAMINATION; PERMITTIVITY MEASUREMENT; POLARIZATION; PYROELECTRICITY; SCANNING; THIN FILMS; ZINC OXIDE;

SCANNING NONLINEAR DIELECTRIC MICROSCOPY (SNDM);

DIELECTRIC FILMS;

EID: 0033726430     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3121     Document Type: Article

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