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Volumn 457, Issue 3, 2000, Pages 377-382
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Lattice relaxation of ZnO single crystal (0001) surface
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL LATTICES;
ETCHING;
LATTICE CONSTANTS;
MORPHOLOGY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
RELAXATION PROCESSES;
SCATTERING;
SINGLE CRYSTALS;
SPECTROSCOPY;
SURFACE ROUGHNESS;
COAXIAL IMPACT-COLLISION ION SCATTERING SPECTROSCOPY (CAICISS);
LOW ENERGY ION SCATTERING (LEIS);
ZINC OXIDE;
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EID: 0034630984
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(00)00436-2 Document Type: Article |
Times cited : (35)
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References (16)
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