Polymer nanostructured components machined directly by the Atomic Force Microscopy scratching method

International Journal of Precision Engineering and Manufacturing

Volumn 13, Issue 2, 2012, Pages 269-273

  Da Yan, Yong ^a   Gao, Da Wei ^a   Hu, Zhen Jiang ^a   Zhao, Xue Sen ^a   Yan, Jiu Chun ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Atomic Force Microscopy (AFM); Nanomechanical scratching; Nanostructures; Taguchi method

Indexed keywords

EID: 84863115658     PISSN: 12298557     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12541-012-0033-3     Document Type: Article

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