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Volumn 27, Issue 5-8 SPEC. ISS., 2007, Pages 1456-1460
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Nanoscale patterning and deformation of soft matter by scanning probe microscopy
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Author keywords
Amorphous carbon; Force lithography; Nanoindentation; Pile up; Polymer; SPM
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Indexed keywords
AMORPHOUS CARBON;
ATOMIC FORCE MICROSCOPY;
NANOINDENTATION;
POLYETHYLENE TEREPHTHALATES;
THIN FILMS;
CONTACT FORCE PULSES;
FORCE LITHOGRAPHY;
NANOSCALE DEFORMATION;
SURFACE NANOPATTERNING;
SURFACE TREATMENT;
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EID: 34547680048
PISSN: 09284931
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msec.2006.08.004 Document Type: Article |
Times cited : (35)
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References (15)
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