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Volumn 27, Issue 5-8 SPEC. ISS., 2007, Pages 1456-1460

Nanoscale patterning and deformation of soft matter by scanning probe microscopy

Author keywords

Amorphous carbon; Force lithography; Nanoindentation; Pile up; Polymer; SPM

Indexed keywords

AMORPHOUS CARBON; ATOMIC FORCE MICROSCOPY; NANOINDENTATION; POLYETHYLENE TEREPHTHALATES; THIN FILMS;

EID: 34547680048     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msec.2006.08.004     Document Type: Article
Times cited : (35)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.