Amount of substance measurement homogeneity principle: The discrepancy between XRCD and watt balance results

Metrologia

Volumn 49, Issue 1, 2012, Pages 62-69

  Yi, Hong ^a   Li, Tiejun ^b   Wang, Xu ^b   Zhang, Fusong ^b   Huo, Weiguo ^b   Yi, Wei ^c  

^a NATIONAL INSTITUTE OF METROLOGY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

AVOGADRO CONSTANT; CHEMICAL CONVERSIONS; ISOTOPE FRACTIONATION; MOLECULAR LEVELS; NAOH SOLUTIONS; PLANCK CONSTANTS; PREPARATION PROCESS; RELATIVE UNCERTAINTY; SAMPLE PREPARATION; SINGLE CRYSTAL SILICON; WATT BALANCE;

ISOTOPES; METRIC SYSTEM; SINGLE CRYSTALS;

SILICON WAFERS;

EID: 84862939586     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/49/1/010     Document Type: Article

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