Bipolar resistance switching characteristics with opposite polarity of Au/SrTiO 3/Ti memory cells

Nanoscale Research Letters

Volumn 6, Issue , 2011, Pages 1-8

  Sun, Xianwen ^a   Li, Guoqiang ^a   Chen, Li ^a   Shi, Zihong ^a   Zhang, Weifeng ^a  

^a HENAN UNIVERSITY   (China)

Author keywords

Au SrTiO 3 Ti; Bipolar resistance switching; Schottky barrier

Indexed keywords

BIPOLAR RESISTANCE SWITCHING; DEFECT DISTRIBUTION; INTERFACE DEFECTS; MEMORY CELL; RESISTANCE SWITCHING; SCHOTTKY BARRIERS; TRAPPING/DETRAPPING;

DEFECTS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR STORAGE;

SWITCHING;

EID: 84862909191     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-599     Document Type: Article

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