The current image of single SnO 2 nanobelt nanodevice studied by conductive atomic force microscopy

Nanoscale Research Letters

Volumn 6, Issue , 2011, Pages 1-6

  Wang, Shujie ^a   Cheng, Gang ^a   Cheng, Ke ^a   Jiang, Xiaohong ^a   Du, Zuliang ^a  

^a HENAN UNIVERSITY   (China)

Author keywords

C afm; Current image; Nanobelt; SnO 2

Indexed keywords

AFM TIP; AU ELECTRODES; BARRIER-TYPE JUNCTIONS; C-AFM; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT IMAGE; ELECTRONIC TRANSPORT PROPERTIES; I - V CURVE; NANO DEVICE; NANO-DEVICES; SCHOTTKY; SNO 2;

ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; SCHOTTKY BARRIER DIODES; TRANSPORT PROPERTIES;

NANOBELTS;

EID: 84862908976     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-541     Document Type: Article

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