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Journal of Electron Spectroscopy and Related Phenomena

Volumn 185, Issue 1-2, 2012, Pages 18-22

Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS

(10) Denny, Yus Rama a Shin, Hye Chung a Seo, Soonjoo a Oh, Suhk Kun a Kang, Hee Jae a Tahir, Dahlang b Heo, Sung c Chung, Jae Gwan c Lee, Jae Cheol c Tougaard, Sven d

a Chungbuk National University (South Korea)

b HASANUDDIN UNIVERSITY (Indonesia)

c Samsung Advanced Institute of Technology (SAIT) (South Korea)

d UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

Electrical properties; HIZO; Optical properties; REELS; XPS

Indexed keywords

BAND GAPS; DIELECTRIC FUNCTIONS; EXTINCTION COEFFICIENTS; GAINZNO; GLASS SUBSTRATES; HIZO; INDIUM ZINC OXIDES; MIXED-METALS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; TRANSMISSION COEFFICIENTS; VISIBLE REGION;

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; GALLIUM; HAFNIUM; OPTICAL PROPERTIES; REELS; REFRACTIVE INDEX; SUBSTRATES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRIC PROPERTIES;

EID: 84862809571 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2011.12.004 Document Type: Article

Times cited : (50)

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