SCOPUS 정보 검색 플랫폼

Volumn 42, Issue 6-7, 2010, Pages 906-910

Electronic and optical properties of GIZO thin film grown on SiO 2/Si substrates

(10) Tahir, Dahlang b Lee, Eun Kyoung a Kwon, Hyuk Lan a Oh, Suhk Kun a Kang, Hee Jae a Heo, Sung c Lee, Eun Ha c Chung, Jae Gwan c Lee, Jae Cheol c Tougaard, Sven d

a Chungbuk National University (South Korea)

b HASANUDDIN UNIVERSITY (Indonesia)

c Samsung Advanced Institute of Technology (SAIT) (South Korea)

d UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

Bandgap; GIZO; REELS; XPS

Indexed keywords

BAND GAPS; BAND-GAP VALUES; BANDGAP; CONCENTRATION RATIO; DIELECTRIC FUNCTIONS; ELECTRON ENERGY LOSS SPECTRUM; ENERGY LOSS; EXTINCTION COEFFICIENTS; QUANTITATIVE ANALYSIS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPIES; SI SUBSTRATES; TRANSMISSION COEFFICIENTS; VISIBLE REGION; XPS;

DISSOCIATION; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LEVELS; ENERGY DISSIPATION; ENERGY GAP; GALLIUM; LIGHT TRANSMISSION; NUCLEAR INSTRUMENTATION; REELS; REFRACTIVE INDEX; SILICON COMPOUNDS; THIN FILMS; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77954253017 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3364 Document Type: Conference Paper

Times cited : (21)

References (18)

1
- 60749103290
- W. Lim, E. A. Douglas, S. H. Kim, D. P. Norton, S. J. Pearton, F. Ren, H. Shen, W. H. Chang, Appl. Phys. Lett. 2009, 94, 072103.
- (2009) Appl. Phys. Lett. , vol.94 , pp. 072103
- Lim, W.¹ Douglas, E.A.² Kim, S.H.³ Norton, D.P.⁴ Pearton, S.J.⁵ Ren, F.⁶ Shen, H.⁷ Chang, W.H.⁸

2
- 60049085321
- Y. K. Moon, S. Lee, J. W. Park, D. H. Kim, J. H. Lee, C. O. Jeong, J. Korean Phys. Soc. 2009, 54, 121.
- (2009) J. Korean Phys. Soc. , vol.54 , pp. 121
- Moon, Y.K.¹ Lee, S.² Park, J.W.³ Kim, D.H.⁴ Lee, J.H.⁵ Jeong, C.O.⁶

3
- 34547365696
- J. S. Park, J. K. Jeong, Y. G. Mo, H. D. Kim, S. I. Kim, Appl. Phys. Lett. 2007, 90, 262106.
- (2007) Appl. Phys. Lett. , vol.90 , pp. 262106
- Park, J.S.¹ Jeong, J.K.² Mo, Y.G.³ Kim, H.D.⁴ Kim, S.I.⁵

4
- 56249132738
- T. Kamiya, K. Nomura, M. Hirano, H. Hosono, Phys. Status Solidi C 2008, 5, 3098.
- (2008) Phys. Status Solidi C , vol.5 , pp. 3098
- Kamiya, T.¹ Nomura, K.² Hirano, M.³ Hosono, H.⁴

5
- 41549135660
- A. J. Leenheer, J. D. Perkins, M. F. A. M. van Hest, J. J. Berry, R. P. O'Hayre, D. S. Ginley, Phys. Rev. B 2008, 77, 115215.
- (2008) Phys. Rev. B , vol.77 , pp. 115215
- Leenheer, A.J.¹ Perkins, J.D.² Van Hest, M.F.A.M.³ Berry, J.J.⁴ O'Hayre, R.P.⁵ Ginley, D.S.⁶

6
- 34548454544
- D. Kang, L. Song, C. Kim, Y. Park, T. D. Kang, H. S. Lee, Jw. Park, S. H. Choi, H. Lee, Appl. Phys. Lett. 2007, 91, 091910.
- (2007) Appl. Phys. Lett. , vol.91 , pp. 091910
- Kang, D.¹ Song, L.² Kim, C.³ Park, Y.⁴ Kang, T.D.⁵ Lee, H.S.⁶ Park, Jw.⁷ Choi, S.H.⁸ Lee, H.⁹

7
- 77953573667
- Version 3.0
- S. Tougaard, F. Yubero, QUEELS-ε(k, ω)-REELS: Software Package for Quantitative Analysis of Electron Energy Loss Spectra; Dielectric Function Determined by Reflection Electron Energy Loss Spectroscopy, Version 3. 0, 2008, See http://www. quases. com.
- (2008) QUEELS-ε(κ, ω)-REELS: Software Package for Quantitative Analysis of Electron Energy Loss Spectra; Dielectric Function Determined by Reflection Electron Energy Loss Spectroscopy
- Tougaard, S.¹ Yubero, F.²

8
- 41549142209
- S. Hajati, O. Romanyuk, J. Zemek, S. Tougaard, Phys. Rev. B 2008, 77, 155403.
- (2008) Phys. Rev. B , vol.77 , pp. 155403
- Hajati, S.¹ Romanyuk, O.² Zemek, J.³ Tougaard, S.⁴

9
- 0003449924
- Wiley-VCH: New York
- A. Montaser, D. W. Golightly, InductivelyCoupled Plasma in Analytical Atomic Spectroscopy, Wiley-VCH: New York, 1992.
- (1992) Inductively Coupled Plasma in Analytical Atomic Spectroscopy
- Montaser, A.¹ Golightly, D.W.²

10
- 66549129085
- D. Tahir, E. K. Lee, T. T. Tham, S. K. Oh, H. J. Kang, J. Hua, S. Heo, J. C. Park, J. G. Chung, J. C. Lee, Appl. Phys. Lett. 2009, 94, 212902.
- (2009) Appl. Phys. Lett. , vol.94 , pp. 212902
- Tahir, D.¹ Lee, E.K.² Tham, T.T.³ Oh, S.K.⁴ Kang, H.J.⁵ Hua, J.⁶ Heo, S.⁷ Park, J.C.⁸ Chung, J.G.⁹ Lee, J.C.¹⁰

11
- 62949219686
- E. Nogales, B. Sanchez, B. Mendez, J. Piqueras, Superlattices Microstruct. 2009, 45, 156.
- (2009) Superlattices Microstruct. , vol.45 , pp. 156
- Nogales, E.¹ Sanchez, B.² Mendez, B.³ Piqueras, J.⁴

12
- 41749087573
- F. Fuchs, F. Bechstedt, Phys. Rev. B 2008, 77, 155107.
- (2008) Phys. Rev. B , vol.77 , pp. 155107
- Fuchs, F.¹ Bechstedt, F.²

13
- 56349147762
- M. N. Huda, Y. Yan, S. H. Wei, M. M. Al-Jassim, Phys. Rev. B 2008, 78, 195204.
- (2008) Phys. Rev. B , vol.78 , pp. 195204
- Huda, M.N.¹ Yan, Y.² Wei, S.H.³ Al-Jassim, M.M.⁴

14
- 4444295658
- S. Tougaard, F. Yubero, Surf. Interface Anal. 2004, 36, 824.
- (2004) Surf. Interface Anal. , vol.36 , pp. 824
- Tougaard, S.¹ Yubero, F.²

15
- 0001576082
- S. Tougaard, I. Chorkendorff, Phys. Rev. B 1987, 35, 6570. Information on the QUASES-XS. REELS software can be found at www.quases.com.
- (1987) Phys. Rev. B , vol.35 , pp. 6570
- Tougaard, S.¹ Chorkendorff, I.²

16
- 0003740393
- Academic Press: New York
- F. Wooten, Optical Properties of Solid, Academic Press: New York, 1972.
- (1972) Optical Properties of Solid
- Wooten, F.¹

17
- 70350724181
- D. Tahir, E. K. Lee, S. K. Oh, H. J. Kang, S. Heo, J. G. Chung, J. C. Lee, S. Tougaard, J. Appl. Phys. 2009, 106, 084108.
- (2009) J. Appl. Phys. , vol.106 , pp. 084108
- Tahir, D.¹ Lee, E.K.² Oh, S.K.³ Kang, H.J.⁴ Heo, S.⁵ Chung, J.G.⁶ Lee, J.C.⁷ Tougaard, S.⁸

18
- 33947577629
- A. Suresh, P. Wellenius, A. Dhawan, J. Muth, Appl. Phys. Lett. 2007, 90, 123512.
- (2007) J. Muth, Appl. Phys. Lett. , vol.90 , pp. 123512
- Suresh, A.¹ Wellenius, P.² Dhawan, A.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.