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Volumn 85, Issue 23, 2012, Pages

Electron backscattering from stacking faults in SiC by means of ab initio quantum transport calculations

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Indexed keywords


EID: 84862695018     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.235310     Document Type: Article
Times cited : (33)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.