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Applied Physics Letters

Volumn 98, Issue 2, 2011, Pages

Charged basal stacking fault scattering in nitride semiconductors

(4) Konar, Aniruddha a Fang, Tian a Sun, Nan a Jena, Debdeep a

a UNIVERSITY OF NOTRE DAME (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASAL STACKING FAULTS; CHARGE TRANSPORT; CHARGE TRANSPORT IN SEMICONDUCTORS; EXPERIMENTAL DATA; GALLIUM NITRIDE FILMS; NITRIDE SEMICONDUCTORS; QUANTUM TUNNELING;

GALLIUM ALLOYS; GALLIUM NITRIDE; QUANTUM CHEMISTRY;

STACKING FAULTS;

EID: 78751538259 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3543846 Document Type: Article

Times cited : (22)

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