Localized electronic states around stacking faults in silicon carbide

Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 3, 2002, Pages 332031-332034

  Iwata, Hisaomi ^a   Öberg, Sven ^c   Briddon, Patrick R ^d   Lindefelt, Ulf ^a,b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b ABB CORPORATE RESEARCH   (Sweden)

^c LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

^d NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037080807     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)