Evaluation of high-precision phase-shifting electron holography by using hologram simulation

Surface and Interface Analysis

Volumn 35, Issue 1, 2003, Pages 60-65

  Yamamoto, Kazuo ^a   Hirayama, Tsukasa ^a   Tanji, Takayoshi ^b   Hibino, Michio ^c  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c AICHI INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electron holography; Phase shifting; Simulation

Indexed keywords

COMPUTER SIMULATION; DISTORTION (WAVES); ELECTRIC FIELDS; ELECTROMAGNETIC WAVE DIFFRACTION; EVALUATION; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; PHASE MEASUREMENT; SPURIOUS SIGNAL NOISE; TWO DIMENSIONAL;

ELECTRON BIPRISM; FRESNEL CORRECTIONS; FRESNEL DIFFRACTION; PHASE SHIFTING ELECTRON HOLOGRAPHY; QUANTUM NOISE;

ELECTRON HOLOGRAPHY;

EID: 0037257195     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1494     Document Type: Article

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