Ene-like reaction of cyclopentene on Si(001)-2 × 1: An XPS and NEXAFS study

Journal of Physical Chemistry C

Volumn 116, Issue 23, 2012, Pages 12680-12686

  Khaliq, Anzar ^a   Pierucci, Debora ^a,b   Tissot, Héloïse ^a,b   Gallet, Jean Jacques ^a,b   Bournel, Fabrice ^a,b   Rochet, François ^a,b   Silly, Mathieu ^b   Sirotti, Fausto ^b  

^a Universit Pierre et Marie Curie Paris 6   (France)

^b SYNCHROTRON SOLEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION STUDIES; CYCLOPENTENES; DEPOSITION TEMPERATURES; DOUBLE BONDS; ELECTRICAL ELEMENTS; HYBRID STRUCTURE; NANO SCALE; OPTIMAL CHEMICALS; OPTIMUM CONDITIONS; ORDERED ARRAY; ORGANIC/INORGANIC SEMICONDUCTORS; REACTION CHANNELS; ROOM TEMPERATURE; SI(0 0 1); SILICON SURFACES; SINGLE-MOLECULE;

ADSORPTION; BUFFER LAYERS; CHEMICAL BONDS; CRYSTAL GROWTH; DIMERS; MOLECULAR CRYSTALS; OPTICAL WAVEGUIDES; SEMICONDUCTING SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

SILICON;

EID: 84862289266     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp302952m     Document Type: Article

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