Carbon contamination of soft X-ray beamlines: Dramatic anti-reflection coating effects observed in the 1 keV photon energy region

Journal of Synchrotron Radiation

Volumn 18, Issue 5, 2011, Pages 761-764

  Chauvet, C ^a   Polack, F ^a   Silly, M G ^a   Lagarde, B ^a   Thomasset, M ^a   Kubsky, S ^a   Duval, J P ^a   Risterucci, P ^a   Pilette, B ^a   Yao, I ^a   Bergeard, N ^a   Sirotti, F ^a  

^a SYNCHROTRON SOLEIL   (France)

Author keywords

beamline optics; carbon contamination; optical thin film; X ray reflectivity

Indexed keywords

ABSORPTIVITIES; BEAMLINE OPTICS; CARBON CONTAMINATION; CARBON DEPOSITES; CARBON DEPOSITION; CARBON THIN FILMS; DESTRUCTIVE INTERFERENCE; FLUENCES; OPTICAL THIN FILM; PHOTON ENERGY REGIONS; SCATTER RADIATION; SOFT X-RAY; SPECTRAL REGION; X RAY REFLECTIVITY;

REFLECTION; THIN FILMS; VAPOR DEPOSITION; X RAY OPTICS;

X RAYS;

EID: 80052140667     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049511023119     Document Type: Article

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