Control and characterization of cyclopentene unimolecular dissociation on Si(100) with scanning tunneling microscopy

Journal of the American Chemical Society

Volumn 131, Issue 29, 2009, Pages 10059-10065

  Yoder, Nathan L ^a   Fakonas, James S ^a   Hersam, Mark C ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; BIASING CONDITIONS; C-C DOUBLE BONDS; CYCLOPENTENE; DISSOCIATION PRODUCTS; FEED-BACK LOOP; MULTI-BIAS; SEMI-CONDUCTOR SURFACES; SI(1 0 0); SI(100) SURFACE; SINGLE MOLECULE REACTION; SPATIAL RESOLUTION; TRANSIENT REACTION; TUNNELING CURRENT; ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPIES; UNIMOLECULAR DISSOCIATION;

ATOMS; CHEMICAL BONDS; DENSITY FUNCTIONAL THEORY; DISSOCIATION; GRAFTING (CHEMICAL); SCANNING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE REACTIONS; SYNTHESIS (CHEMICAL); VACUUM; WIND TUNNELS;

FEEDBACK;

CARBON; CYCLOPENTENE DERIVATIVE; DIMER; HYDROGEN; RADICAL; SILICON;

ARTICLE; ATOM; CHEMICAL ANALYSIS; CHEMICAL BOND; CHEMICAL REACTION; COVALENT BOND; DENSITY FUNCTIONAL THEORY; DISSOCIATION; FEEDBACK SYSTEM; MOLECULAR DYNAMICS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; VACUUM;

COMPUTER SIMULATION; CYCLOPENTANES; MICROSCOPY, SCANNING TUNNELING; MODELS, CHEMICAL; PARTICLE SIZE; SILICON; SURFACE PROPERTIES; TIME FACTORS;

EID: 67651230083     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja9010546     Document Type: Article

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