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Volumn 60, Issue 4, 1999, Pages 2930-2940

Soft-x-ray photoelectron, x-ray absorption, and autoionization spectroscopy of 1,5-cyclooctadiene on Si(001)−2×1

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000995721     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.2930     Document Type: Article
Times cited : (17)

References (29)
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    • J. Stöhr, in NEXAFS Spectroscopy, edited by R. Gomer, Springer Series in Surface Science Vol. 25 (Springer-Verlag, Berlin, 1992).
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  • 23
    • 0003025966 scopus 로고
    • NEXAFS Spectroscopy
    • in, R. Gomer, Springer-Verlag, Berlin
    • J. Stöhr, in NEXAFS Spectroscopy, edited by R. Gomer, Springer Series in Surface Science Vol. 25 (Springer-Verlag, Berlin, 1992), p. 186.
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    • Stöhr, J.1
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    • NEXAFS Spectroscopy
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    • J. Stöhr, in NEXAFS Spectroscopy, edited by R. Gomer, Springer Series in Surface Science Vol. 25 (Springer-Verlag, Berlin, 1992), p. 190.
    • (1992) Springer Series in Surface Science , vol.25 , pp. 190
    • Stöhr, J.1
  • 27
    • 0003025966 scopus 로고
    • NEXAFS Spectroscopy
    • in, R. Gomer, Springer-Verlag, Berlin
    • J. Stöhr, in NEXAFS Spectroscopy, edited by R. Gomer, Springer Series in Surface Science Vol. 25 (Springer-Verlag, Berlin, 1992), p. 284.
    • (1992) Springer Series in Surface Science , vol.25 , pp. 284
    • Stöhr, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.