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Applied Physics Letters

Volumn 100, Issue 19, 2012, Pages

Nanoscale quantification of octahedral tilts in perovskite films

(4) Hwang, Jinwoo a Zhang, Jack Y a Son, Junwoo a Stemmer, Susanne a

a University of California (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAXIAL TENSILE STRESS; BULK MATERIALS; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); INPLANE ROTATION; MULTI SLICES; NANO SCALE; OUT-OF-PLANE; PEROVSKITE FILMS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; ULTRA-THIN;

EPITAXIAL FILMS; PEROVSKITE; TRANSMISSION ELECTRON MICROSCOPY;

ULTRATHIN FILMS;

EID: 84862106888 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4714734 Document Type: Article

Times cited : (57)

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