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Volumn 60, Issue 6-7, 2012, Pages 3239-3246
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Aberration-corrected scanning transmission electron microscopy study of β′-like precipitates in an Al-Mg-Ge alloy
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Author keywords
Aluminium alloys; High angle annular dark field; Precipitation; Scanning transmission electron microscopy
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Indexed keywords
ABERRATION-CORRECTED;
AL-CONCENTRATION;
AL-MG-GE;
AL-MG-SI ALLOYS;
ATOMIC RADIUS;
COHERENT INTERFACE;
HAADF-STEM;
HIGH-ANGLE ANNULAR DARK FIELDS;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
VACANCY CONCENTRATION;
ALUMINUM ALLOYS;
CERIUM ALLOYS;
GERMANIUM;
NEEDLES;
PRECIPITATION (CHEMICAL);
SILICON;
SILICON ALLOYS;
TRANSMISSION ELECTRON MICROSCOPY;
ALUMINUM;
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EID: 84859104265
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2012.02.039 Document Type: Article |
Times cited : (24)
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References (29)
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