Determining ferroelectric polarity at the nanoscale

Applied Physics Letters

Volumn 98, Issue 5, 2011, Pages

  Lebeau, James M ^a   D'Alfonso, Adrian J ^b   Wright, Nicholas J ^a   Allen, Leslie J ^b   Stemmer, Susanne ^a  

^a University of California   (United States)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DISPLACEMENT; CONVERGENT-BEAM ELECTRON DIFFRACTION; NANO SCALE; REAL-SPACE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; UNIT CELLS;

BARIUM COMPOUNDS; FERROELECTRIC MATERIALS; FERROELECTRICITY; NANOSTRUCTURED MATERIALS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 79951494425     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3549300     Document Type: Article

References (19)

1. A. Gruverman, B. J. Rodriguez, C. Dehoff, J. D. Waldrep, A. I. Kingon, R. J. Nemanich, and J. S. Cross, Appl. Phys. Lett. 0003-6951 87, 082902 (2005). 10.1063/1.2010605 (Pubitemid 41247063)
2. D. A. Bonnell, S. V. Kalinin, A. L. Kholkin, and A. Gruverman, MRS Bull. 0883-7694 34, 648 (2009).
3. D. D. Fong, G. B. Stephenson, S. K. Streiffer, J. A. Eastman, O. Auciello, P. H. Fuoss, and C. Thompson, Science 0036-8075 304, 1650 (2004). 10.1126/science.1098252 (Pubitemid 38765852)
4. L. Rimai, J. L. Parsons, J. T. Hickmott, and T. Nakamura, Phys. Rev. 0031-899X 168, 623 (1968). 10.1103/PhysRev.168.623
5. M. Tanaka and G. Honjo, J. Phys. Soc. Jpn. 0031-9015 19, 954 (1964). 10.1143/JPSJ.19.954
6. L. Houben, A. Thust, and K. Urban, Ultramicroscopy 0304-3991 106, 200 (2006). 10.1016/j.ultramic.2005.07.009 (Pubitemid 41820577)
7. S. Stemmer, S. K. Streiffer, F. Ernst, and M. Ruhle, Philos. Mag. A 0141-8610 71, 713 (1995). 10.1080/01418619508244477
8. C. L. Jia, V. Nagarajan, J. Q. He, L. Houben, T. Zhao, R. Ramesh, K. Urban, and R. Waser, Nature Mater. 1476-1122 6, 64 (2007). 10.1038/nmat1808 (Pubitemid 46043270)
9. J. Taftø and J. C. H. Spence, J. Appl. Crystallogr. 0021-8898 15, 60 (1982). 10.1107/S0021889882011352
10. L. J. Allen and C. J. Rossouw, Phys. Rev. B 0556-2805 39, 8313 (1989). 10.1103/PhysRevB.39.8313
11. C. J. Rossouw, P. R. Miller, J. Drennan, and L. J. Allen, Ultramicroscopy 0304-3991 34, 149 (1990). 10.1016/0304-3991(90)90069-X
12. Z. H. Zhang, X. Y. Qi, and X. F. Duan, Appl. Phys. Lett. 0003-6951 89, 242905 (2006). 10.1063/1.2405380 (Pubitemid 44974948)
13. J. M. LeBeau, S. D. Findlay, L. J. Allen, and S. Stemmer, Ultramicroscopy 0304-3991 110, 118 (2010). 10.1016/j.ultramic.2009.10.001
14. B. Jalan, R. Engel-Herbert, N. J. Wright, and S. Stemmer, J. Vac. Sci. Technol. A 0734-2101 27, 461 (2009). 10.1116/1.3106610
15. J. M. LeBeau, A. J. D'Alfonso, S. D. Findlay, S. Stemmer, and L. J. Allen, Phys. Rev. B 0556-2805 80, 174106 (2009). 10.1103/PhysRevB.80.174106
16. J. M. LeBeau, S. D. Findlay, L. J. Allen, and S. Stemmer, Phys. Rev. Lett. 0031-9007 100, 206101 (2008). 10.1103/PhysRevLett.100.206101 (Pubitemid 351748227)
17. R. J. Nelmes and W. F. Kuhs, Solid State Commun. 0038-1098 54, 721 (1985). 10.1016/0038-1098(85)90595-2 (Pubitemid 15510879)
18. R. H. Buttner and E. N. Maslen, Acta Crystallogr., Sect. B: Struct. Sci. 0108-7681 48, 764 (1992). 10.1107/S010876819200510X
19. 3 with tilt.