On the research of lead-free material challengers for PZT replacement

Solid-State Electronics

Volumn 75, Issue , 2012, Pages 6-12

  Fasquelle, D ^a   Mascot, M ^a   Carru, J C ^a  

^a UNIVERSITÉ DU LITTORAL CÔTE D OPALE   (France)

Author keywords

BST; BTS; Ferroelectric; Piezoelectric; Sol gel; Thin films

Indexed keywords

ANNEALING TEMPERATURES; ANNEALING TIME; AVERAGE SIZE; BST; BTS; ELECTRONIC DEVICE; FERROELECTRIC PROPERTY; LEAD-FREE MATERIAL; OPTIMIZED ANNEALING CONDITIONS; PIEZOELECTRIC; PIEZOELECTRICS; PZT; REMNANT POLARIZATIONS; SOL-GEL ROUTES; TIO;

ANNEALING; FERROELECTRIC MATERIALS; FERROELECTRICITY; PIEZOELECTRICITY; SOL-GEL PROCESS; SOL-GELS; THIN FILMS; TIN;

ELECTRIC PROPERTIES;

EID: 84861839483     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2012.04.031     Document Type: Article

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