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Journal of Applied Physics

Volumn 92, Issue 2, 2002, Pages 889-894

Ramification of micropipes in SiC crystals

(7) Gutkin, M Yu a Sheinerman, A G a Argunova, T S b,c Je, J H c Kang, H S c Hwu, Y d Tsai, W L d

a INSTITUTE OF PROBLEMS OF MECHANICAL ENGINEERING (Russian Federation)

b IOFFE INSTITUTE (Russian Federation)

c Pohang University of Science and Technology (POSTECH) (South Korea)

d INSTITUTE OF PHYSICS (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATED MICROPIPES; DISLOCATION LINES; MICROPIPES; SURFACE AREA; SYNCHROTRON X-RAY RADIOGRAPHY;

OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE;

DISLOCATIONS (CRYSTALS);

EID: 84861426548 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1488247 Document Type: Article

Times cited : (19)

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