Coherence-based edge diffraction sharpening of x-ray images: A simple model

Journal of Applied Physics

Volumn 85, Issue 7, 1999, Pages 3406-3408

  Margaritondo, G ^a,b   Tromba, G ^a  

^a SINCROTRONE TRIESTE   (Italy)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000447801     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369697     Document Type: Article

References (10)

1. For a recent short review, see G. Margaritondo, Phys. World 11, 28 (1998).
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5. D. Chapman et al., Phys. Med. Biol. 42, 2015 (1997).
6. For a discussion of the coherence aspects of synchrotron sources, see Y. Takayama, T. Hatano, T. Miyahara, and W. Okamoto, J. Synchrotron Radiat. 5, 1187 (1998).
7. A. Pogany, D. Gao, and S. W. Wilkins, Rev. Sci. Instrum. 58, 2774 (1997).
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10. Y. Hwu, B. Lai, D. Mancini, M. Bertolo, G. Tromba, and G. Margaritondo (unpublished).