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Volumn 67, Issue 1, 2012, Pages 65-68

Effect of the surface on ion-beam damage build-up in ZnO

Author keywords

Implantation; Interface defects; Intermediate defect peak; Semiconductor

Indexed keywords

INTERFACE DEFECTS; INTERMEDIATE DEFECT PEAK; LATTICE DISORDERS; RUTHERFORD BACKSCATTERING/CHANNELING; ZNO; ZNO SINGLE CRYSTALS; ZNO SURFACE;

EID: 84861195040     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2012.03.021     Document Type: Article
Times cited : (12)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.