Role of pH of precursor solution in taming the material properties of spray pyrolysed SnS thin films

Applied Surface Science

Volumn 258, Issue 18, 2012, Pages 6870-6875

  Sajeesh, T H ^a   Jinesh, K B ^b   Kartha, C Sudha ^a   Vijayakumar, K P ^a  

^a Department of Physics   (India)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Chemical spray pyrolysis; Opto electronic properties; Photovoltaic, Compound semiconductors; Structural properties; Thin films

Indexed keywords

ABSORPTION SPECTROSCOPY; CRACKING (CHEMICAL); DEPOSITION; ELECTRONIC PROPERTIES; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY GAP; IV-VI SEMICONDUCTORS; LAYERED SEMICONDUCTORS; LIGHT ABSORPTION; OPTICAL PROPERTIES; PH; SCANNING ELECTRON MICROSCOPY; SOLUTION MINING; SPRAY PYROLYSIS; STRUCTURAL PROPERTIES; THIN FILMS; TIN COMPOUNDS; X RAY DIFFRACTION;

CHEMICAL SPRAY PYROLYSIS; COMPOUND SEMICONDUCTORS; DEVICE QUALITY; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL MEASUREMENT; OPTOELECTRONIC PROPERTIES; PRECURSOR SOLUTIONS; SNS THIN FILMS;

SULFUR COMPOUNDS;

EID: 84861092474     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.03.121     Document Type: Article

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