Influence of thickness on structural and optical properties of evaporated tin sulphide films

Micro and Nano Letters

Volumn 6, Issue 7, 2011, Pages 473-475

  Cheng, Shuying ^a   Zhang, Hong ^a  

^a FUZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITED FILMS; GLASS SUBSTRATES; ROOM TEMPERATURE; SNS FILMS; SPECTROSCOPY MEASUREMENTS; STRUCTURAL AND OPTICAL PROPERTIES; TIN SULPHIDE;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ENERGY GAP; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THERMAL EVAPORATION; TIN; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

OPTICAL PROPERTIES;

NANOFILM; SULFIDE; TIN SULFIDE; UNCLASSIFIED DRUG;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; EVAPORATION; NEAR INFRARED SPECTROSCOPY; PHYSICAL CHEMISTRY; RAMAN SPECTROMETRY; ROOM TEMPERATURE; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; THICKNESS; X RAY DIFFRACTION;

EID: 84862908017     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl.2011.0072     Document Type: Article

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