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Nanoscale

Volumn 4, Issue 10, 2012, Pages 3105-3110

Scanning ion conductance microscopy studies of amyloid fibrils at nanoscale

(6) Zhang, Shuai a Cho, Sang Joon b Busuttil, Katerina a Wang, Chen c Besenbacher, Flemming a Dong, Mingdong a

a AARHUS UNIVERSITY (Denmark)

b Research and Development Center (South Korea)

c NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY (China)

Author keywords

[No Author keywords available]

Indexed keywords

3D MORPHOLOGY; AFM; ALTERNATING CURRENT; AMYLOID FIBRIL; AMYLOID PROTEINS; HEIGHT MEASUREMENT; IMAGING PRINCIPLE; ION CONDUCTANCE; MECHANICAL DEFORMATION; NANO SCALE; NANOSCALE RESOLUTIONS; NUCLEATION AND GROWTH; PHYSIOLOGICAL CONDITION; SCANNING PROBE MICROSCOPY TECHNIQUES; SHARP TIP; SOFT OBJECTS;

AGGREGATES; ATOMIC FORCE MICROSCOPY; DEFORMATION; GLYCOPROTEINS; MORPHOLOGY; NANOTECHNOLOGY; THREE DIMENSIONAL;

PROTEINS;

EID: 84860754431 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c2nr12049f Document Type: Article

Times cited : (26)

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