Effect of film thickness on structural, electrical, and optical properties of Sol-Gel deposited layer-by-layer ZnO nanoparticles

Transactions on Electrical and Electronic Materials

Volumn 13, Issue 2, 2012, Pages 102-105

  Shariffudin, S S ^a   Salina, M ^a   Herman, S H ^a   Rusop, M ^a  

^a UNIVERSITI TEKNOLOGI MARA   (Malaysia)

Author keywords

Electrical properties; Film thickness; Optical properties; Structural properties; ZnO nanoparticles

Indexed keywords

CURRENT-VOLTAGE MEASUREMENTS; DEPOSITED LAYER; LAYER-BY-LAYERS; OPTICAL BAND GAP ENERGY; OPTICAL TRANSMITTANCE SPECTRUM; PHOTOLUMINESCENCE SPECTRUM; SOL-GEL SPIN COATING; UV EMISSIONS; UV-VIS SPECTRA; VISIBLE EMISSIONS; XRD; ZNO NANOPARTICLES; ZNO THIN FILM;

FILM THICKNESS; METALLIC FILMS; NANOPARTICLES; OPTICAL FILMS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SOL-GEL PROCESS; SOL-GELS; STRUCTURAL PROPERTIES; THIN FILMS;

ELECTRIC PROPERTIES;

EID: 84860685629     PISSN: 12297607     EISSN: 20927592     Source Type: Journal    
DOI: 10.4313/TEEM.2012.13.2.102     Document Type: Article

References (21)

1. K.-H. Bang, D.-K. Hwang, and J.-M. Myoung, App. Surf. Sci. 207, 359 (2003) [DOI: 10.1016/S0169-4332(03)00005-9].
2. E. S. Shim, H. S. Kang, J. S. Kang, J. H. Kim, and S. Y. Lee, App. Surf. Sci. 186, 474 (2002) [DOI: 10.1016/S0169-4332(01)00746-2].
3. M. Karaliunas, T. Serevicius, E. Kuokstis, S. Juršnas, S. Y. Ting, J. J. Huang, and C. C. Yang, Adv. Mater. Res. 222, 86 (2011) [DOI:10.4028/www.scientific.net/AMR.222.86].
4. C. Wongchoosuk, K. Subannajui, A. Menzel, I. A. Burshtein, S. Tamir, Y. Lifshitz, and M. Zacharias, J. Phys. Chem. C 115, 757(2011) [DOI: 10.1021/jp110416v].
5. D. C. Kim, B.H. Kong, and H. K. Cho, J. Mater. Sci. 19, 760 (2008) [DOI: 10.1007/s10854-007-9404-4].
6. W. J. Jeong, S. K. Kim, and G. C. Park, Thin Solid Films 506-507, 180 (2006) [DOI: 10.1016/j.tsf.2005.08.213].
7. S. M. Hossein Hejazi, F. Majidi, M. Pirhadi Tavandashti, and M. Ranjbar, Mater. Sci. Semicond. Process 13, 267 (2011) [DOI: 10.1016/j.mssp.2010.12.004].
8. J. Sengupta, R. K. Sahoo, K. K. Bardhan, and C. D. Mukherjee, Mater. Lett. 65, 2572 (2011) [DOI: 10.1016//j.matlet.2011.06.021].
9. M. Bouderbala, S. Hamzaoui, B. Amrani, A. H. Reshak, M. Adnane, T. Sahraoui, and M. Zerdali, Phys. Rev. B: Condens. Matter 403, 3326 (2008) [DOI: 10.1016/j.physb.2008.04.045].
10. S. S. Shariffudin, F. S. Farah, S. H. Herman, B. Mahmood, and M. Rusop, Adv.Mater. Res. 364, 149 (2011) [DOI: 10.4028/www.scientific.net/AMR.364.149].
11. J. H. Lee, K. H. Ko, and B. O. Park, J. Cryst. Growth 247, 119 (2003) [DOI: 10.1016/S0022-0248(02)01970-3].
12. Y.-S. Kim, W.-P. Tai, and S.-J. Shu, Thin Solid Films 491, 153 (2005) [DOI: 10.1016/j.tsf.2005.06.013].
13. L. Xu, X. Li, Y. Chen, and F. Xu, Appl. Surf. Sci. 257, 4031 (2010) [DOI: 10.1016/j.apsusc.2010.11.170].
14. M. Jung, J. Lee, S. Park, H. Kim, and J. Chang, J. Cryst. Growth 283, 384 (2005) [DOI: 10.1016/j.jcrysgro.2005.06.047].
15. Y. Zhang, B. Lin, Z. Fu, C. Liu, and W. Han, Opt. Mater. 28, 1192 (2006) [DOI: 10.1016/j.optmat.2005.08.016]
16. S. Mridha and D. Basak, Mater. Res. Bull. 42, 875 (2007) [DOI: 10.1016/j.materresbull.2006.08.019]
17. G. Srinivasan, N. Gopalakrishnan, Y. S. Yu, R. Kesavamoorthy, and J. Kumar, Superlattices Microstruct. 43, 112 (2008) [DOI: 10.1016/j.spmi.2007.07.032].
18. P. Sagar, P. K. Shishodia, R. M. Mehra, H. Okada, A. Wakahara, and A. Yoshida, J. Lumin. 126, 800 (2007) [DOI: 10.1016/j.jlumin.2006.12.003].
19. S. O'Brien, L. H. K. Koh, and G. M. Crean, Thin Solid Films 516, 1391 (2008) [DOI: 10.1016/j.tsf.2007.03.160].
20. A. Van Dijken, E. A. Meulenkamp, D. Vanmaekelbergh, and A. Meijerink, J. Phys. Chem. 104, 1715 (2000) [DOI: 10.1021/jp993327z].
21. D. Bao, H. Gu, and A. Kuang, Thin Solid Films 312, 37 (1998) [DOI: 10.1016/S0040-6090(97)00302-7].