Microstructure and optical studies of electron beam evaporated ZnSe 1-xTe x nanocrystalline thin films

Journal of Alloys and Compounds

Volumn 532, Issue , 2012, Pages 16-24

  Emam Ismail, M ^a,b   El Hagary, M ^a,c   Shaaban, E R ^d   Al Hedeib, A M ^a  

^a QASSIM UNIVERSITY   (Saudi Arabia)

^b Ain Shams University   (Egypt)

^c Helwan University   (Egypt)

^d Al Azhar University   (Egypt)

Author keywords

II VI Semiconductor; Nanomaterial; Optical properties of thin film; Single oscillator model for nanomaterial

Indexed keywords

ANNEALING EFFECTS; BOWING PARAMETERS; DEPOSITED FILMS; ELECTRON BEAM DEPOSITIONS; FUNDAMENTAL BAND GAP; GLASS SUBSTRATES; II-VI SEMICONDUCTOR; NANOCRYSTALLINE THIN FILMS; NANOCRYSTALLINES; NANOMATERIAL; OPTICAL PROPERTIES OF THIN FILMS; OPTICAL STUDY; POLYCRYSTALLINE; REFRACTIVE INDEX DISPERSION; SINGLE-OSCILLATOR MODEL; X-RAY DIFFRACTION TECHNIQUES; ZINC BLEND STRUCTURE;

CHEMICAL MODIFICATION; ELECTRON BEAMS; NANOSTRUCTURED MATERIALS; OSCILLATORS (MECHANICAL); SUBSTRATES; TELLURIUM; TELLURIUM COMPOUNDS; X RAY DIFFRACTION;

REFRACTIVE INDEX;

EID: 84860619174     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2012.04.013     Document Type: Article

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