Optical properties and structure of amorphous (As0.33S 0.67)100-xTex and GexSb 40-xS60 chalcogenide semiconducting alloy films deposited by vacuum thermal evaporation

Journal of Physics D: Applied Physics

Volumn 39, Issue 9, 2006, Pages 1793-1799

  Marquez E ^a   Bernal Oliva, A M ^a   Gonzalez Leal J M ^a   Prieto Alcon R ^a   Wagner, T ^b  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DISPERSIONS; EVAPORATION; GERMANIUM; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS;

FILM STRUCTURE; GLASSY NETWORK; VACUUM THERMAL EVAPORATION; WEMPLE-DIDOMENICO SINGLE-OSCILLATOR;

AMORPHOUS FILMS;

EID: 33646414496     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/9/014     Document Type: Article

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