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Current Applied Physics

Volumn 10, Issue 1, 2010, Pages 193-198

Growth, structural and optical properties of CdxZn1-xS thin films deposited using spray pyrolysis technique

(3) Raviprakash, Y a Bangera, Kasturi V a Shivakumar, G K a

a NATIONAL INSTITUTE OF TECHNOLOGY KARNATAKA (India)

Author keywords

EDAX; SEM; Semiconductor thin films; Spray pyrolysis; UV Vis spectrophotometer; XRD

Indexed keywords

EDAX; SEM; SEMICONDUCTOR THIN FILMS; UV-VIS SPECTROPHOTOMETER; XRD;

CADMIUM; CRACKING (CHEMICAL); ENERGY GAP; INDICATORS (CHEMICAL); INFRARED SPECTROPHOTOMETERS; LIGHT TRANSMISSION; METEOROLOGICAL INSTRUMENTS; OPTICAL PROPERTIES; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SPECTROPHOTOMETERS; SPECTROPHOTOMETRY; STRUCTURAL PROPERTIES; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC SULFIDE;

SPRAY PYROLYSIS;

EID: 69249212307 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2009.05.020 Document Type: Article

Times cited : (46)

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