Optical investigation of electron-beam-deposited tungsten-tellurite (TeO2)100-x(WO3)x amorphous films

Philosophical Magazine

Volumn 90, Issue 25, 2010, Pages 3499-3509

  Emam Ismail, M ^a,d   Shaaban, E R ^b,d   El Hagary, M ^c,d   Shaltout, I ^b  

^a Ain Shams University   (Egypt)

^b Al Azhar University   (Egypt)

^c Helwan University   (Egypt)

^d QASSIM UNIVERSITY   (Saudi Arabia)

Author keywords

optical properties; refractive index; thin film; tungsten tellurite glass

Indexed keywords

ABSORPTION COEFFICIENTS; COMPOSITIONAL DEPENDENCE; DECREASE LINEARLY; DISPERSION MODELS; ELECTRON BEAM EVAPORATION; ENVELOPE METHOD; OPTICAL INVESTIGATION; SPECTRAL DEPENDENCES; TUNGSTEN OXIDE; TUNGSTEN TELLURITE GLASS;

AMORPHOUS FILMS; GLASS; LIGHT REFRACTION; OXIDE FILMS; OXIDES; REFRACTIVE INDEX; REFRACTOMETERS; TELLURIUM COMPOUNDS; THIN FILMS; TUNGSTEN; TUNGSTEN COMPOUNDS;

FILM PREPARATION;

EID: 77954638096     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2010.489890     Document Type: Article

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