Subnanometric stabilization of plasmon-enhanced optical microscopy

Nanotechnology

Volumn 23, Issue 20, 2012, Pages

  Yano, Taka Aki ^a,b,d   Ichimura, Taro ^a,b,e   Kuwahara, Shota ^a,f   Verma, Prabhat ^a,b   Kawata, Satoshi ^a,b,c  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^e RIKEN   (Japan)

^f CHUO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; HIGH PRECISION; HIGH REPRODUCIBILITY; IN-SITU; METALLIC TIPS; NANOMETRICS; OPTICAL IMAGING; OPTICAL SIGNALS; PLASMONIC; ROBUST MEASUREMENT; SUBNANOMETERS; THERMAL DRIFTS; TIME-DEPENDENT;

NANOINDENTATION; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; PLASMONS;

STABILIZATION;

NANOPARTICLE;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; NANOTECHNOLOGY; SCANNING PROBE MICROSCOPY; SURFACE PLASMON RESONANCE; ULTRASTRUCTURE;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, SCANNING PROBE; NANOPARTICLES; NANOTECHNOLOGY; SURFACE PLASMON RESONANCE;

EID: 84860503177     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/20/205503     Document Type: Article

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