Interferometric tracking of optically trapped probes behind structured surfaces: A phase correction method

Applied Optics

Volumn 45, Issue 28, 2006, Pages 7309-7315

  Seitz, Peter C ^a   Stelzer, Ernst H K ^a   Rohrbach, Alexander ^b  

^a EUROPEAN MOLECULAR BIOLOGY LABORATORY   (Germany)

^b UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LENSES; NANOTECHNOLOGY; SURFACE PHENOMENA;

INTERFEROMETRIC SIGNALS; PARTICLE POSITION; PHASE CORRECTION; TRAPPED PROBES;

PROBES;

EID: 33750890304     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.007309     Document Type: Article

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