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Volumn , Issue , 2011, Pages 94-97

Atomic layer deposited Al 2O 3 dielectrics using ozone functionalization of graphene

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITED; C-V MEASUREMENT; FUNCTIONALIZATIONS; GRAPHENE DEVICES; HIGH-K DIELECTRIC; NUCLEATION SITES; ROOM TEMPERATURE;

EID: 84860430696     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NMDC.2011.6155319     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 4
    • 78649335282 scopus 로고    scopus 로고
    • Graphene-dielectric integration for graphene transistors
    • L. Liao and X. Duan, "Graphene-dielectric integration for graphene transistors," Materials Science and Engineering: R: Reports 70, pp. 354-370, (2010).
    • (2010) Materials Science and Engineering: R: Reports , vol.70 , pp. 354-370
    • Liao, L.1    Duan, X.2
  • 5
    • 77956444490 scopus 로고    scopus 로고
    • Silicon Nitride Gate Dielectrics and Band Gap Engineering in Graphene Layers
    • W. J. Zhu, D. Neumayer, V. Perebeinos and P. Avouris, "Silicon Nitride Gate Dielectrics and Band Gap Engineering in Graphene Layers," Nano Lett., Vol. 10, pp. 3572-3576, (2010).
    • (2010) Nano Lett. , vol.10 , pp. 3572-3576
    • Zhu, W.J.1    Neumayer, D.2    Perebeinos, V.3    Avouris, P.4
  • 10
    • 77649176721 scopus 로고    scopus 로고
    • Electron-electron interactions and doping dependence of the two-phonon Raman intensity in graphene
    • D. M. Basko, S. Piscanec and A. C. Ferrari, "Electron-electron interactions and doping dependence of the two-phonon Raman intensity in graphene," Phys. Rev. B, Vol. 80, 165413, (2009)
    • (2009) Phys. Rev. B , vol.80 , pp. 165413
    • Basko, D.M.1    Piscanec, S.2    Ferrari, A.C.3
  • 11
    • 64549141075 scopus 로고    scopus 로고
    • Mobility extraction and quantum capacitance impact in high performance graphene field-effect transistor devices
    • presented at the unpublished
    • C. Zhihong and J. Appenzeller, "Mobility extraction and quantum capacitance impact in high performance graphene field-effect transistor devices," presented at the Electron Devices Meeting, 2008. IEDM 2008. IEEE International, 2008 (unpublished)
    • Electron Devices Meeting, 2008. IEDM 2008. IEEE International, 2008
    • Zhihong, C.1    Appenzeller, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.