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Applied Physics Letters

Volumn 99, Issue 6, 2011, Pages

Measurement, analysis, and modeling of 1/f noise in pentacene thin film transistors

(3) Kang, Hongki a Jagannathan, Lakshmi a Subramanian, Vivek a,b

a UNIVERSITY OF CALIFORNIA (United States)

b Sunchon National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; CARRIER TRAPPING; CURRENT NOISE MEASUREMENTS; GRAIN SIZE; LOW-FREQUENCY NOISE; NOISE BEHAVIOR; NOISE MODELING; NOISE MODELS; OPERATING REGIONS; PENTACENE THIN FILM TRANSISTORS; PENTACENES;

DRAIN CURRENT; THERMAL NOISE; THIN FILM DEVICES; TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 84860393370 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3622651 Document Type: Article

Times cited : (29)

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