Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

Journal of Applied Crystallography

Volumn 45, Issue 2, 2012, Pages 367-370

  Neuschitzer, Markus ^a   Moser, Armin ^a   Neuhold, Alfred ^a   Kraxner, Johanna ^b   Stadlober, Barbara ^b   Oehzelt, Martin ^c   Salzmann, Ingo ^d   Resel, Roland ^a   Novák, Jiří ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b JOANNEUM RESEARCH   (Austria)

^c HAHN MEITNER INSTITUT   (Germany)

^d HUMBOLDT UNIVERSITY   (Germany)

Author keywords

grazing incidence in plane X ray diffraction; monolayers; thin films

Indexed keywords

GRADED MULTILAYERS; GRAZING INCIDENCE; HIGH POTENTIAL; LABORATORY EQUIPMENTS; ORGANIC FILMS; PENTACENE THIN FILMS; PENTACENES; PHASE ANALYSIS; POSITION-SENSITIVE DETECTORS; SYNCHROTRON RADIATION FACILITY; ULTRA-THIN;

FILM PREPARATION; LABORATORIES; MONOLAYERS; THIN FILMS; X RAY DIFFRACTION; X RAY TUBES;

MULTILAYERS;

EID: 84859749163     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812000908     Document Type: Article

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