Grazing incidence in-plane X-ray diffraction in the laboratory

Powder Diffraction

Volumn 19, Issue 1, 2004, Pages 45-48

  Tanner, B K ^a   Hase, T P A ^a   Lafford, T A ^a,b   Goorsky, M S ^a,c  

^a DURHAM UNIVERSITY   (United Kingdom)

^b Bede Scientific Instruments Ltd   (United Kingdom)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FULLWIDTH AT HALF-HEIGHT MAXIMUM (FWHM); GRAZING INCIDENCE IN-PLANE DIFFRACTION (GIXD);

CRYSTAL GROWTH; CRYSTAL LATTICES; DIFFRACTOMETERS; LANGMUIR BLODGETT FILMS; POLYCRYSTALLINE MATERIALS; SAPPHIRE; SYNCHROTRON RADIATION; THIN FILMS; VECTORS; ZINC OXIDE;

X RAY DIFFRACTION ANALYSIS;

EID: 1842456994     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1649319     Document Type: Article

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