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Volumn 23, Issue 1, 2011, Pages 127-131

Thin film structure of triisopropylsilylethynyl-functionalized pentacene and tetraceno[2,3-b]thiophene from grazing incidence x-ray diffraction

(3) Mannsfeld, Stefan C B a Tang, Ming Lee b Bao, Zhenan b

a SLAC NATIONAL ACCELERATOR LABORATORY (United States)

b Stanford University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK SINGLE CRYSTALS; FUNCTIONALIZED; FUNCTIONALIZED PENTACENE; GRAZING INCIDENCE X-RAY DIFFRACTION; MOLECULAR ARRANGEMENTS; MOLECULAR PACKINGS; THIN-FILM STRUCTURE; TIPS-PENTACENE;

DIFFRACTION; OXIDE FILMS; SEMICONDUCTING SILICON COMPOUNDS; SILICON OXIDES; THIN FILM DEVICES; THIN FILMS; THIOPHENE; X RAY DIFFRACTION;

SINGLE CRYSTALS;

BIS(TRIISOPROPYLSILYLETHYNYL)PENTACENE; NAPHTHACENE DERIVATIVE; ORGANOSILICON DERIVATIVE; TETRACENO(2,3 B)THIOPHENE; TETRACENO(2,3-B)THIOPHENE; THIOPHENE DERIVATIVE;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; X RAY DIFFRACTION;

MOLECULAR STRUCTURE; NAPHTHACENES; ORGANOSILICON COMPOUNDS; THIOPHENES; X-RAY DIFFRACTION;

EID: 78650702460 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201003135 Document Type: Article

Times cited : (152)

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