Reflectivity of very low energy electrons (< 10 eV) from solid surfaces: Physical and instrumental aspects

Journal of Applied Physics

Volumn 111, Issue 6, 2012, Pages

  Cazaux, Jacques ^a  

^a Faculty of Sciences   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE OF INCIDENCE; ENERGY SPREADS; INCIDENT ELECTRONS; INCIDENT ENERGY; LABORATORY MEASUREMENTS; LOCAL VACUUM LEVEL; LOW ENERGY ELECTRON MICROSCOPY; LOW ENERGY ELECTRONS; MATERIAL COMPOSITIONS; MODERN TECHNOLOGIES; PLASMA PHYSICS; QUANTUM MECHANICAL; REFLECTION PROPERTIES; SOLID SAMPLES; SOLID SURFACE; SURFACE SENSITIVITY; THIN-FILM TRANSMISSION;

BALLOONS; ELECTRON MICROSCOPY; QUANTUM THEORY; RADIATION DAMAGE; REFLECTION; SPACE RESEARCH;

SURFACES;

EID: 84859526773     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3691956     Document Type: Article

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