Grain contrast imaging in UHV SLEEM

Materials Transactions

Volumn 51, Issue 2, 2010, Pages 292-296

  Mikmeková, Šárka ^a   Hovorka, Miloš ^a   Müllerová, Ilona ^a   Man, Ondřej ^b   Pantělejev, Libor ^b   Frank, Luděk ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

^b BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Electron backscatter diffraction (EBSD); Grain contrast; Scanning low energy electron microscopy; Ultra fine grained materials

Indexed keywords

BACK-SCATTERED; CATHODE LENS; CONTRAST IMAGING; CRYSTALLINE ORIENTATIONS; EBSD METHOD; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION (EBSD); ELECTRON ENERGIES; ENERGY DEPENDENCE; FAST DATA ACQUISITION; GRAIN ORIENTATION; GRAIN STRUCTURES; HIGH RESOLUTION; LOW ANGLE GRAIN BOUNDARIES; LOW ENERGY ELECTRON MICROSCOPES; LOW ENERGY ELECTRON MICROSCOPY; LOW ENERGY ELECTRONS; SCANNING ELECTRON MICROSCOPE; SLOW ELECTRONS; ULTRAFINE GRAINED MATERIALS;

BACKSCATTERING; BALLOONS; DISSOCIATION; ELECTRON DIFFRACTION; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; EQUAL CHANNEL ANGULAR PRESSING; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; LENSES; OPTICAL INSTRUMENTS; PRESSING (FORMING); REFLECTION; SCANNING; SCANNING ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

ELECTRONS;

EID: 77949718926     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.MC200919     Document Type: Article

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