Sharp reduction of the secondary electron emission yield from grooved surfaces

Journal of Applied Physics

Volumn 104, Issue 10, 2008, Pages

  Pivi, M ^a   King, F K ^a   Kirby, R E ^a   Raubenheimer, T O ^a   Stupakov, G ^a   Le Pimpec, F ^b  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; MAGNETIC FIELDS;

ANALYTICAL STUDIES; CHARACTERISTIC PARAMETERS; GROOVED SURFACES; MONTE CARLO APPROACHES; PARTICLE SIMULATIONS; ROUGH SURFACES; SECONDARY ELECTRON EMISSIONS; SECONDARY ELECTRON YIELDS; STRONG MAGNETIC FIELDS;

SECONDARY EMISSION;

EID: 57049145766     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3021149     Document Type: Article

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