Structural and optical investigation of nanocrystalline Zn 1-xNi xS diluted magnetic semiconductor thin films

Journal of Alloys and Compounds

Volumn 529, Issue , 2012, Pages 113-121

  Emam Ismail, M ^a,b   El Hagary, M ^a,c   Shaaban, E R ^a,d   Althoyaib, S ^a  

^a QASSIM UNIVERSITY   (Saudi Arabia)

^b Ain Shams University   (Egypt)

^c Helwan University   (Egypt)

^d Al Azhar University   (Egypt)

Author keywords

Absorption and reflection; Atomic force microscope (AFM); Light transmission; Nanostructured materials; Optical materials; Optical properties; Semiconductors; Thin films; Vapor deposition; X ray diffraction

Indexed keywords

AFM; ATOMIC FORCE; COORDINATION NUMBER; DEPOSITED FILMS; DILUTED MAGNETIC SEMICONDUCTORS; DIRECT TRANSITION; ELECTRON BEAM DEPOSITIONS; GROUP VELOCITIES; NANO SCALE; NANO-SIZE; NANOCRYSTALLINE FILMS; NANOCRYSTALLINES; NI IONS; NI-DOPED; OPTICAL ENERGY GAP; OPTICAL INVESTIGATION; POLARIZABILITIES; REFLECTION SPECTRA; REFRACTIVE INDEX DISPERSION; S-SYSTEMS; SINGLE-OSCILLATOR MODEL; SOLUBILITY LIMITS; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURE PARAMETER; TYPE STRUCTURES; WAVE NUMBERS; WAVENUMBER METHOD; WIDE SPECTRAL RANGE; X-RAY DIFFRACTION MEASUREMENTS; ZINCBLEND;

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; DISPERSIONS; ELECTRON BEAMS; LIGHT TRANSMISSION; MAGNETIC SEMICONDUCTORS; NANOSTRUCTURED MATERIALS; OPTICAL MATERIALS; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; ZINC; ZINC SULFIDE;

REFRACTIVE INDEX;

EID: 84859500704     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2012.03.027     Document Type: Article

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